event
Atom Probe Tomography: Applications and Techniques
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Atom Probe Tomography (APT) is the highest spatial resolution analytical characterization technique with high efficiency single atom detection for quantitative atomic scale 3D elemental mapping of chemical heterogeneities. Learn more about this technique and how it may be applied to your research at this event.
Agenda Topics:
Atom Probe Tomography (APT): Operational Theory
Introduction to APT Data Reduction
Introduction to APT Sample Preparation
APT Applications
- Metals: Integration with Advanced Modeling
- Ceramics, high performance materials
- Semiconductor Devices: Planar and finFET, LED Devices, III/V
- Geological Materials and Biominerals
Correlative synergy
- t-EBSD
- TEM
- EPMA
Atom Probe Tomography Instrumentation
Lunch will be provided.
Attendance is free of charge but space is limited!
To register, please complete the registration form by August 8th 2017
Register Here
Status
- Workflow Status:Published
- Created By:Christa Ernst
- Created:07/27/2017
- Modified By:Christa Ernst
- Modified:07/27/2017
Keywords
- Tomography
- Atom probe tomography
- Characterization techniques
- microscopy
- materials science
- Nanotechnology
- thin films
- materials defects
- metals
- ceramics
- Advanced Semiconductor Manufacturing
- defect inspection
- the Institute for Electronics and Nanotechnology
- the institute for materials
- The School of Materials Science and Engineering
- The School of Mechanical Engineering
- the School of Electrical and Computer Engineering
Target Audience