{"593771":{"#nid":"593771","#data":{"type":"event","title":"Atom Probe Tomography: Applications and Techniques","body":[{"value":"\u003Cp\u003EAtom Probe Tomography (APT) is the highest spatial resolution analytical characterization technique with high efficiency single atom detection for quantitative atomic scale 3D elemental mapping of chemical heterogeneities. Learn more about this technique and how it may be applied to your research at this event.\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003EAgenda Topics:\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003EAtom Probe Tomography (APT): Operational Theory\u003Cbr \/\u003E\r\nIntroduction to APT Data Reduction\u003Cbr \/\u003E\r\nIntroduction to APT Sample Preparation\u003Cbr \/\u003E\r\nAPT Applications\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003EMetals: Integration with Advanced Modeling\u003C\/li\u003E\r\n\t\u003Cli\u003ECeramics, high performance materials\u003C\/li\u003E\r\n\t\u003Cli\u003ESemiconductor Devices: Planar and finFET, LED Devices, III\/V\u003C\/li\u003E\r\n\t\u003Cli\u003EGeological Materials and Biominerals\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003ECorrelative synergy\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003Et-EBSD\u003C\/li\u003E\r\n\t\u003Cli\u003ETEM\u003C\/li\u003E\r\n\t\u003Cli\u003EEPMA\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003EAtom Probe Tomography Instrumentation\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003ELunch will be provided.\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003EAttendance is free of charge but space is limited!\u003Cbr \/\u003E\r\nTo register, please complete the registration form by August 8th 2017\u003Cbr \/\u003E\r\n\u003Ca href=\u0022http:\/\/events.r20.constantcontact.com\/register\/event?llr=m48bm8rab\u0026amp;oeidk=a07eed6z0yj7b28d580\u0022\u003E\u003Cstrong\u003ERegister Here\u003C\/strong\u003E\u003C\/a\u003E\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"Learn more about this technique and how it may be applied to your research at this event."}],"uid":"27863","created_gmt":"2017-07-27 15:31:44","changed_gmt":"2017-07-27 16:36:44","author":"Christa Ernst","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2017-08-15T12:45:00-04:00","event_time_end":"2017-08-15T14:15:00-04:00","event_time_end_last":"2017-08-15T14:15:00-04:00","gmt_time_start":"2017-08-15 16:45:00","gmt_time_end":"2017-08-15 18:15:00","gmt_time_end_last":"2017-08-15 18:15:00","rrule":null,"timezone":"America\/New_York"},"extras":["free_food"],"related_files":{"248861":{"fid":null,"name":"Clockwise from left: Researchers Joel Kostka, Jose Rolando, Tianze Song, Max Kolton. (Photo: Joel Kostka Lab)","file_path":"\/sites\/default\/files\/images\/kostka.jpg","file_full_path":"http:\/\/hg.gatech.edu\/\/sites\/default\/files\/images\/kostka.jpg","mime":"image\/jpeg","size":990066,"description":null}},"groups":[{"id":"197261","name":"Institute for Electronics and Nanotechnology"}],"categories":[],"keywords":[{"id":"174999","name":"Tomography"},{"id":"174916","name":"Atom probe tomography"},{"id":"175000","name":"Characterization techniques"},{"id":"7392","name":"microscopy"},{"id":"2294","name":"materials science"},{"id":"107","name":"Nanotechnology"},{"id":"87681","name":"thin films"},{"id":"175001","name":"materials defects"},{"id":"174569","name":"metals"},{"id":"74261","name":"ceramics"},{"id":"170441","name":"Advanced Semiconductor Manufacturing"},{"id":"174700","name":"defect inspection"},{"id":"166968","name":"the Institute for Electronics and Nanotechnology"},{"id":"58001","name":"the institute for materials"},{"id":"168357","name":"The School of Materials Science and Engineering"},{"id":"173625","name":"The School of Mechanical Engineering"},{"id":"168380","name":"the School of Electrical and Computer Engineering"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"10377","name":"Career\/Professional development"},{"id":"1795","name":"Seminar\/Lecture\/Colloquium"},{"id":"26411","name":"Training\/Workshop"}],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"78771","name":"Public"},{"id":"174045","name":"Graduate students"},{"id":"78751","name":"Undergraduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003E\u003Cstrong\u003EEric Woods\u003C\/strong\u003E - Georgia Tech: Institute for Electronics and Nanotechnology \u0026amp; Materials Characterization Facility\u003Cbr \/\u003E\r\n\u003Ca href=\u0022mailto:paul.joseph@ien.gatech.edu\u0022\u003Eeric,woods@ien.gatech.edu\u003C\/a\u003E\u003Cbr \/\u003E\r\n404.385.2877\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u0026nbsp;\u003C\/p\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}