593771
event
1501169504
1501173404
<![CDATA[Atom Probe Tomography: Applications and Techniques]]>
Atom Probe Tomography (APT) is the highest spatial resolution analytical characterization technique with high efficiency single atom detection for quantitative atomic scale 3D elemental mapping of chemical heterogeneities. Learn more about this technique and how it may be applied to your research at this event.
Agenda Topics:
Atom Probe Tomography (APT): Operational Theory
Introduction to APT Data Reduction
Introduction to APT Sample Preparation
APT Applications
- Metals: Integration with Advanced Modeling
- Ceramics, high performance materials
- Semiconductor Devices: Planar and finFET, LED Devices, III/V
- Geological Materials and Biominerals
Correlative synergy
Atom Probe Tomography Instrumentation
Lunch will be provided.
Attendance is free of charge but space is limited!
To register, please complete the registration form by August 8th 2017
Register Here
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Eric Woods - Georgia Tech: Institute for Electronics and Nanotechnology & Materials Characterization Facility
eric,woods@ien.gatech.edu
404.385.2877
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