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MCF Workshop - Overview to Atomic Force Microscopy
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This workshop will provide attendees first-hand knowledge on Atomic Force Microscopy (AFM). Topic that will be covered include:
- Theoretical basis of Atomic Force Microscopy
- Important considerations when choosing an AFM instrument
- Applications for AFM measurements
- Hands-on measurement with model samples
Register at: https://learnaboutafhatgt.eventbrite.com
Contact Dr. Walter Henderson at: walter.henderson@ien.gatech.edu for more information.
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- Workflow status: Published
- Created by: Christa Ernst
- Created: 08/30/2018
- Modified By: Christa Ernst
- Modified: 08/30/2018
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