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event
1535642813
1535642813
<![CDATA[MCF Workshop - Overview to Atomic Force Microscopy]]>
This workshop will provide attendees first-hand knowledge on Atomic Force Microscopy (AFM). Topic that will be covered include:
- Theoretical basis of Atomic Force Microscopy
- Important considerations when choosing an AFM instrument
- Applications for AFM measurements
- Hands-on measurement with model samples
Register at: https://learnaboutafhatgt.eventbrite.com
Contact Dr. Walter Henderson at: walter.henderson@ien.gatech.edu for more information.
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Dr. Walter Henderson: walter.henderson@ien.gatech.edu
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<![CDATA[the Institute for Electronics and Nanotechnology]]>
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