ToF-SIMS: WHAT IS STATE-OF-THE-ART

Dr. Nathan Havercroft
ION-TOF USA, Chestnut Ridge, NY
Thursday, March 3, 2016 from 12:00PM to 1:00PM
Marcus Nanotechnology Building | 345 Ferst Drive | Atlanta GA 30332 | Room 1116

In many scientific fields State-of-the-Art is a term used to describe an almost constant change in technology. This is especially true in Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS), where recent advances have opened up many new research opportunities.

Historically, ToF-SIMS has been limited to the surface analysis of solid state, vacuum compatible, materials that were mainly inorganic in nature. The development of cluster ion beams (Bi n+, C60+ and Arn+) has enabled the routine analysis of organic materials in both two and three dimensions. This has led to key breakthroughs in research areas including organic LEDs, organic photovoltaics, polymer materials and biological cells and tissues. Research has even been performed on liquids in vacuum.

This seminar will give a brief introduction to ToF-SIMS, discussing its key benefits in surface science before giving examples of the many research opportunities it can provide.