The objective of the proposed research is to develop a physical and mathematical framework to explain the origin of 1/fα flicker noise observed in single-channel CFTR recordings. Electrophysiological studies using frequency-domain and time-frequency analysis have demonstrated the presence of flicker noise signatures for specific substates and mutants of CFTR, suggesting that current fluctuations contain information about the conformational structure of the channel. Based on these observations, this work proposes that the dominant source of flicker noise is chloride ion trapping and release processes within the CFTR pore, analogous to trapping-based 1/f noise mechanisms previously developed in semiconductor physics. The proposed research will combine patch-clamp electrophysiology, spectral analysis, modeling, and theoretical development to relate experimentally observed spectral exponents to energy landscapes and trap distributions within the channel. This work aims to establish a new theoretical framework for interpreting flicker noise in ion channels, providing a deeper insight into the physical mechanisms of CFTR function.