With the advances to the semi-conductor industry, highly integrated and sophisticated circuits are developed as system-on-chip. These advances bring forth several challenges such as increased parasitics, increased coupling, diverse range of specifications to be tested and reduced visibility to internal circuit nodes. State-of-the-art test and calibration techniques require expensive equipment on-chip and are time-consuming. Hence the aim of this research is to efficient algorithms for self-calibration of analog/mixed-signal/RF systems that accommodate self-learning capabilities. This research focused on built-in test, post manufacture tuning and real-time adaptation algorithms for mixed-signal/RF systems. The proposed approaches are implemented on a diverse range of circuits such as MIMO receiver, ADC, low drop-out regulator. buck-boost converter and line driver.