The objective of the proposed research is to explore the advanced capabilities of terahertz time-domain spectroscopy (THz-TDS) and pulsed imaging in material analysis and non-invasive inspection. The study aims to improve the non-destructive evaluation techniques for characterizing the structural and dielectric properties of various materials. Utilizing THz-TDS, this research will focus on both enhancing the understanding of the THz dielectric properties of different materials and developing new applications in fields such as quality control, art conservation, and semiconductor inspection. The proposal outlines a plan to investigate the deconvolution from measured signal to get the structural information, the potential for high-resolution imaging, and the development of machine learning algorithms to analyze the terahertz data effectively. By bridging the gap between theoretical analysis and practical applications, this research seeks to advance the state of THz spectroscopy technology and broaden its practical applications in industrial and research settings.