For a diverse range of applications in materials and life sciences, this talk will focus on the Nano-IR capabilities for measuring chemical composition and optical properties with nanometer scale spatial resolution. AFM-IR based infrared spectroscopy with true model free spectra and scattering scanning near field optical microscopy (s-SNOM) both overcome the diffraction limit. Together they provide an unrivaled capability to perform nanoscale chemical/optical analysis on a diverse range of organic, inorganic, photonic and electronic materials.

*This seminar is FREE of charge but registration is required to receive complementary lunch*

Data will include measurements from:

• Skin to core variations in single fibers
• Polymer interfaces
• Protein secondary structure
• Semiconductors
• Graphene surface plasmons
• hBN phonon polariton, and nano-antennas

Register to attend and secure your lunch for the event here.

For additional information: http://www.anasysinstruments.com or contact Jay Anderson: jay@anasysinstruments.com