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Atomic Force Microscopy User Meeting

During this meeting Bruker will have a technical presentation by our Senior Application Scientist, John Thornton, on sample prep, liquid imaging, high aspect ratio imaging & some of the latest electrical advances in AFM.
 
Following John’s presentation we have reserved time through 5PM for questions and discussion about technical issues. We will be ready to discuss your AFM questions:
·       How-to questions
·       Instrument optimization
·       Software manipulation
·       Upgrades, etc.
 
We are providing attendee beverages and snacks and will therefore need an accurate count of attendees.  Please register early and keep us up to date on your attendance.

REGISTER ONLINE: www.bruker.com/BNS-NA_workshops
FIRST 25 TO REGISTER WILL RECEIVE FREE AFM PROBES!

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Thursday
Jan 28 2016
09:30am - 04:00pm

Contact: Rathi Monikandan: rjeevagan3@mail.gatech.edu

Email: rjeevagan3@mail.gatech.edu

URL: http://www.ien.gatech.edu

Extras: Free food

Fees: N/A

In campus calendar: Yes

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  • Workflow Status:Published
  • Created By:Christa Ernst
  • Created:01/26/2016
  • Modified By:Fletcher Moore
  • Modified:04/13/2017

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