Agilent Technologies invites you to join us for a dynamic workshop focusing on the research capabilities of our new 7500 AFM. Designed to extend the frontier of atomic force microscopy for both academia and industry, the 7500 achieves atomic-resolution imaging with a 90μm AFM closed-loop scanner, provides unrivaled environmental control and monitoring, and offers an unprecedented range of functionality.

Application-oriented presentations will be delivered by scientists from Agilent and Georgia Tech with hands-on sessions using Agilent’s new 7500 atomic force microscope.

Agenda

• 10:00AM  Registraion
• 10:30AM  Introduction
• 10:35AM  Parallelization of Thermochemical Nanolithography with Xi Lu of Georgia Tech
• 11:05AM  The New 7500: Electrical Characterization of Nanoscale Materials with Gil Min of Agilent
• 11:45AM  Lunch
• 12:45PM Hands-On Sessions - Agilent 7500 AFM
• 2:00PM Wrap-Up and Comments with Bob Hirche of Agilent
• 2:00-4:00PM  Demonstration and Sample Analysis - by appointment only

RSVP
Bob Hirche
bob@icmas.com or 865-984-8058
You can make an arrangement for individual showing and possible sample analysis. This is best done by contacting Bob Hirche in advance. We will accommodate as many as we can.