Title:  Characterization And Mitigation Of Single-Event Effects In Rf Circuits And Systems

Committee:

Dr. John Cressler, ECE, Chair , Advisor

Dr. Hua Wang, ECE

Dr. Nelson Lourenco, ECE

Dr. Shimeng Yu, ECE

Dr. Glenn Lightsey, AE

Abstract: Space is a hostile environment for electronic systems. The levels of ionizing radiation in space can strongly limit the performance and reliability of spacecraft payloads. When energized particles pass through electronic systems, they can generate voltage and current spikes known as single-event transients (SETs). These SETs can propagate through electrical systems, disrupt their proper operation, and lead to critical issues. In practice, it is not possible to completely shield electronic systems from these particles. Thus, to ensure the proper operation of spacecraft in radiation environments, the risk of these events must be considered. There are three major phases in the risk management process: testing, assessment, and mitigation. This research presents new approaches to test, assess, and mitigate the risk of SETs in electronic systems. Novel testing techniques using ultra-fast pulsed lasers to emulate space radiation are shown. A new metric to assess the impact of SETs in communications systems is presented. Finally, several mitigation techniques for RF communications systems are shown. This work has resulted in new tools and techniques to help designers build more robust electronics for space applications. Ultimately, increasing the robustness of electronics in space systems will improve our capabilities in the areas of global communication, navigation, and space exploration.