Warranty Prediction Based on Auxiliary Use-rate Information

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  • Date/Time:
    • Thursday April 8, 2010
      11:00 am - 12:00 pm
  • Location: ISyE Executive classroom
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Summary Sentence: Warranty Prediction Based on Auxiliary Use-rate Information

Full Summary: Warranty Prediction Based on Auxiliary Use-rate Information

TITLE:  Warranty Prediction Based on Auxiliary Use-rate Information

SPEAKER: Professor William Q. Meeker

ABSTRACT:

Usually the warranty data response used to make predictions of future failures is the number of weeks (or another unit of real time) in service. Use-rate information usually is not available (automobile warranty data are an exception, where both weeks in service and number of miles driven are available for units returned for warranty repair). With new technology, however, sensors and smart chips are being installed in many modern products ranging from computers and printers to automobiles and aircraft engines. Thus the coming generations of field data for many products will provide information on how the product has been used and the environment in which it was used. This paper was motivated by the need to predict warranty returns for a product with multiple failure modes. For this product, cycles-to-failure/use-rate information was available for those units that were connected to the network. We show how to use a cycles-to-failure model to compute predictions and prediction intervals for the number of warranty returns. We also present prediction methods for units not connected to the network. In order to provide insight into the reasons that use-rate models provide better predictions, we also present a comparison of asymptotic variances comparing the cycles-to-failure and time-to-failure models. 

Bio:   William Q. Meeker is a Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He is a Fellow of the American Statistical Association (ASA) and the American Society for Quality (ASQ) and a past Editor of Technometrics. He is co-author of the books Statistical Methods for Reliability Data with Luis Escobar (1998), and Statistical Intervals: A Guide for Practitioners with Gerald Hahn (1991), six book chapters, and of numerous publications in the engineering and statistical literature.  He has won the ASQ Youden prize four times and the ASQ Wilcoxon Prize three times. He was recognized by the ASA with their Best Practical Application Award in 2001 and by the ASQ Statistics Division’s with their W.G. Hunter Award in 2003. In 2007 he was awarded the ASQ Shewhart medal. He has done research and consulted extensively on problems in reliability data analysis, warranty analysis, reliability test planning, accelerated testing, nondestructive evaluation, and statistical computing.

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Status
  • Created By: Anita Race
  • Workflow Status: Published
  • Created On: Apr 5, 2010 - 5:07am
  • Last Updated: Oct 7, 2016 - 9:51pm