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  <title><![CDATA[Ph.D. Dissertation Defense - Nahid Shazon]]></title>
  <body><![CDATA[<p><strong>Title</strong><em>:&nbsp; Modeling, Optimization, and Co-Design of Emerging Memory Technologies at Advanced Technology Nodes</em></p><p><strong>Committee:</strong></p><p>Dr.&nbsp;Azad Naeemi, ECE, Chair, Advisor</p><p>Dr.&nbsp;Jeff Davis, ECE</p><p>Dr.&nbsp;Asif Khan, ECE</p><p>Dr.&nbsp;Shimeng Yu, ECE</p><p>Dr.&nbsp;Eric Vogel, MSE</p>]]></body>
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      <value><![CDATA[Modeling, Optimization, and Co-Design of Emerging Memory Technologies at Advanced Technology Nodes ]]></value>
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      <value><![CDATA[<p>This dissertation presents a multiscale modeling, optimization, and co-design framework for emerging memory technologies at advanced technology nodes, with a primary focus on spin-orbit-torque magnetic random-access memory (SOT-MRAM). A device-level framework is developed to capture nanoscale conduction-current redistribution and the resulting nonuniform spin-current generation in SOT devices, and is subsequently extended to compact two-terminal (2T) SOT-MRAM. For perpendicular-magnetic-anisotropy devices, full-fixed-layer and half-fixed-layer configurations are evaluated to quantify the effects of device geometry, MTJ scaling, and spin-torque efficiencies on write performance, demonstrating that the half-fixed-layer architecture can achieve competitive write energy with reduced out-of-plane spin-torque requirements. The shared read/write path of 2T SOT-MRAM is further investigated using a circuit-to-micromagnetics read-disturbance framework combining layout-extracted circuit simulations, finite-element current modeling, spin drift-diffusion analysis, and rare-event-enhancement-based micromagnetic simulations. The analysis is also extended to in-plane-magnetic-anisotropy devices using AuPt and β-W SOT channels, where the half-fixed-layer configuration reduces switching-current density and write energy. These device-level concepts are then incorporated into a hierarchical 2T SOT-MRAM system and evaluated after physical implementation, demonstrating substantial improvements in area, bit density, and read energy-delay-area product relative to a three-terminal baseline. Finally, advanced interconnect technologies are evaluated within a complete 7 nm SRAM RTL-to-GDS flow to establish an optimized conventional-memory reference, showing that BEOL improvements can significantly enhance SRAM performance and energy efficiency.</p>]]></value>
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      <value><![CDATA[2026-12-02T14:00:00-05:00]]></value>
      <value2><![CDATA[2026-12-02T16:00:00-05:00]]></value2>
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      <value><![CDATA[Room 231A, MiRC]]></value>
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        <url>https://teams.microsoft.com/l/meetup-join/19%3ameeting_MmY0M2U5OGEtMWQ0YS00NWNiLTlkNjYtMzVmMjA0NWQwYjAy%40thread.v2/0?context=%7b%22Tid%22%3a%22482198bb-ae7b-4b25-8b7a-6d7f32faa083%22%2c%22Oid%22%3a%22e60e1475-7062-4ac8-9532-083d75f2854b%22%7d</url>
        <link_title><![CDATA[Microsoft Teams Link ]]></link_title>
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