Committee:

Dr. Abhijit Chatterjee, ECE, Chair , Advisor

Dr. Gregory Durgin, ECE

Dr. Hua Wang, ECE

Dr. Jennifer Hasler, ECE

Dr. Adit Singh, Auburn University

Abstract:

The work presented in this thesis makes inroads toward a unified paradigm for the verification of hierarchical dynamical models and provides various numerical and statistical algorithms for the abstraction of AMS circuits, for quantifying dynamics “lost” in the process of abstracting, for the provision of test vectors for composite AMS systems, and for enabling a unified fault localization scheme. The primary motivation is demand for techniques which leverage available system models without requiring either absolute accuracy or completeness in order to generate improved system-level tests. Methodologies are provided which benefit pass/fail production testing as well as pre- and post-silicon debugging and diagnostic testing of AMS systems.