ISYE SEMINAR SERIES - Reliability and Yield of Microelectronics Products

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In this talk, we present an overview of yield, reliability and burn-in as practiced in the semiconductor manufacturing industry. Reliability and yield modeling can be used as a foundation in developing effective stress burn-in, which in turn can warranty high-quality for semiconductor products. Yield models are described and their advantages and disadvantages are
discussed. It is high reliability, not an efficient scheduling, that can enhance yield of microelectronics products. Stress burn-in and issues related to burn-in, such as optimization and statistical data analysis are
introduced in this talk. Because low yield will likely be a biggest issue in nano manufacturing, this talk will also help deal with reliability enhance strategies for design and manufacturing of nano products.


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  • Created By:
    Barbara Christopher
  • Created:
  • Modified By:
    Fletcher Moore
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