{"610155":{"#nid":"610155","#data":{"type":"event","title":"Practical Surface Characterization of Materials: An Interactive Short Course on XPS, UPS and SIMS: Principles, Practice, Instrumentation and Hands-on Data Analysis","body":[{"value":"\u003Cp\u003EA detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method and ToF-SIMS a mass-spectroscopy-based method complementary in many ways to XPS.\u0026nbsp; Taken together they allow:\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003EThe detection of the elemental composition of a sample\u003C\/li\u003E\r\n\t\u003Cli\u003EThe detection of even trace elements down to ppm of a monolayer\u003C\/li\u003E\r\n\t\u003Cli\u003EThe chemical bonding between elements\u003C\/li\u003E\r\n\t\u003Cli\u003EThe lateral and vertical distribution of elements in the top layers of a sample\u003C\/li\u003E\r\n\t\u003Cli\u003EThe surface bonding and band structure of compounds including work function and band occupancy\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cdiv\u003E\r\n\u003Cp\u003ETarget Audience:\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003EAttendance is open to the general technical community and is not limited to current Georgia Tech students or IEN users.\u003C\/strong\u003E The course will be of value to anyone needing to analyze the physical-chemical properties of surfaces including catalysts; thin-film metals and semiconductors; low-dimensional materials such as graphene, CNT\u0026#39;s, and MoS2; polymers for food packaging or medical implants; corrosion studies in metals; among other materials. The course should prove useful to everyone from the interested novice, unfamiliar with these techniques - but with a practical need for information about the surface composition\/chemistry of a sample - up to those with even a moderately advanced practical XPS or SIMS background looking to develop a deeper understanding.\u003C\/p\u003E\r\n\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003E\r\n\u003Cp\u003E\u003Cstrong\u003ERates\u003C\/strong\u003E:\u003Cstrong\u003E *Rates include lunches on all days*\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003EGeorgia Tech Rate: $150\u003C\/li\u003E\r\n\t\u003Cli\u003EAcademic and Government Rate: $250\u003C\/li\u003E\r\n\t\u003Cli\u003EIndustry Rate: $500\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003ERegistration\u003C\/strong\u003E: Due to the nature of the lab portion of the course, registration has a maximum of 40 participants\u003Cstrong\u003E. \u003C\/strong\u003EYour registration is not guaranteed until full payment is received. If you wish to charge the course to an IEN Cleanroom account, please contact us immediately so that we can provide the proper forms, and so that we may notify the PI or accounts representative. Credit cards are the only payment option for people outside Georgia Tech. Once you submit your registration, follow the appropriate links in your confirmation email. A waiting list of overflow registrants will be maintained in case of cancellations.\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Ca href=\u0022http:\/\/events.r20.constantcontact.com\/register\/event?oeidk=a07eflpax0y1e1b8ff3\u0026amp;llr=m48bm8rab\u0022\u003E\u003Cstrong\u003E\u003Cstrong\u003E\u0026nbsp;Registration Available Here\u003C\/strong\u003E\u003C\/strong\u003E\u003C\/a\u003E\u003C\/p\u003E\r\n\u003C\/div\u003E\r\n\r\n\u003Cp\u003E\u0026nbsp;\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":[{"value":"\u003Cp\u003E\u003Cstrong\u003EAttendance is open to the general technical community and is not limited to current Georgia Tech students or IEN users.\u003C\/strong\u003E The course will be of value to anyone needing to analyze the physical-chemical properties of surfaces including catalysts; thin-film metals and semiconductors; low-dimensional materials such as graphene, CNT\u0026#39;s, and MoS2; polymers for food packaging or medical implants; corrosion studies in metals; among other materials. The course should prove useful to everyone from the interested novice, unfamiliar with these techniques - but with a practical need for information about the surface composition\/chemistry of a sample - up to those with even a moderately advanced practical XPS or SIMS background looking to develop a deeper understanding.\u003C\/p\u003E\r\n","format":"limited_html"}],"field_summary_sentence":[{"value":"A detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method and ToF-SIMS a mass-spectroscopy-based method complementary in many ways to XPS."}],"uid":"27863","created_gmt":"2018-08-22 13:54:07","changed_gmt":"2018-08-22 13:54:07","author":"Christa Ernst","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2018-10-08T10:00:00-04:00","event_time_end":"2018-10-08T18:00:00-04:00","event_time_end_last":"2018-10-08T18:00:00-04:00","gmt_time_start":"2018-10-08 14:00:00","gmt_time_end":"2018-10-08 22:00:00","gmt_time_end_last":"2018-10-08 22:00:00","rrule":"RRULE:FREQ=DAILY;INTERVAL=1;UNTIL=20181010T035959Z;WKST=SU","timezone":"America\/New_York"},"extras":["free_food"],"groups":[{"id":"213791","name":"3D Systems Packaging Research Center"},{"id":"198081","name":"Georgia Electronic Design Center (GEDC)"},{"id":"197261","name":"Institute for Electronics and Nanotechnology"},{"id":"1271","name":"NanoTECH"},{"id":"213771","name":"The Center for MEMS and Microsystems Technologies"}],"categories":[],"keywords":[{"id":"109341","name":"Materials Characterization Facility"},{"id":"166968","name":"the Institute for Electronics and Nanotechnology"},{"id":"168357","name":"The School of Materials Science and Engineering"},{"id":"168380","name":"the School of Electrical and Computer Engineering"},{"id":"1785","name":"nanomaterials"},{"id":"178804","name":"XPS"},{"id":"178805","name":"SIMS"},{"id":"175000","name":"Characterization techniques"},{"id":"168276","name":"lab training"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"10377","name":"Career\/Professional development"},{"id":"26411","name":"Training\/Workshop"}],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"177814","name":"Postdoc"},{"id":"78771","name":"Public"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003E\u003Cstrong\u003EYolande Berta - Sr. Research Scientist, Materials Characterization Facility (MCF)\u003C\/strong\u003E\u003Cbr \/\u003E\r\nGeorgia Tech Materials Characterization Facility\u003Cbr \/\u003E\r\n404.894.2545\u003Cbr \/\u003E\r\n\u003Ca href=\u0022mailto:yb4@mail.gatech.edu\u0022 style=\u0022color: rgb(0, 26, 129);\u0022\u003Eyb4@mail.gatech.edu\u003C\/a\u003E\u003C\/p\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}