{"593482":{"#nid":"593482","#data":{"type":"event","title":"Atom Probe Tomography: Applications and Techniques","body":[{"value":"\u003Cp\u003EAtom Probe Tomography (APT) is the highest spatial resolution analytical characterization technique with high efficiency single atom detection for quantitative atomic scale 3D elemental mapping of chemical heterogeneities. Learn more about this technique and how it may be applied to your research at this event.\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003EAgenda Topics:\u003C\/strong\u003E\u003Cbr \/\u003E\r\nAtom Probe Tomography (APT): Operational Theory\u003Cbr \/\u003E\r\nIntroduction to APT Data Reduction\u003Cbr \/\u003E\r\nIntroduction to APT Sample Preparation\u003Cbr \/\u003E\r\nAPT Applications\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003EMetals: Integration with Advanced Modeling\u003C\/li\u003E\r\n\t\u003Cli\u003ECeramics, high performance materials\u003C\/li\u003E\r\n\t\u003Cli\u003ESemiconductor Devices: Planar and finFET, LED Devices, III\/V\u003C\/li\u003E\r\n\t\u003Cli\u003EGeological Materials and Biominerals\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003ECorrelative synergy\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003Et-EBSD\u003C\/li\u003E\r\n\t\u003Cli\u003ETEM\u003C\/li\u003E\r\n\t\u003Cli\u003EEPMA\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003EAtom Probe Tomography Instrumentation\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003ELunch will be provided.\u003C\/strong\u003E\u003Cbr \/\u003E\r\nRegister at: \u003Cstrong\u003E\u003Ca href=\u0022http:\/\/ien.gatech.edu\/prof-dev\u0022\u003Eien.gatech.edu\/prof-dev\u003C\/a\u003E\u003C\/strong\u003E\u003Cbr \/\u003E\r\nAttendance is free of charge but space is limited!\u003Cbr \/\u003E\r\nTo register, please complete the registration form by August 8th 2017\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"Learn more about this technique and how it may be applied to your research at this event. visualizing"}],"uid":"27863","created_gmt":"2017-07-12 20:09:03","changed_gmt":"2017-07-12 20:09:03","author":"Christa Ernst","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2017-08-15T12:45:00-04:00","event_time_end":"2017-08-15T14:15:00-04:00","event_time_end_last":"2017-08-15T14:15:00-04:00","gmt_time_start":"2017-08-15 16:45:00","gmt_time_end":"2017-08-15 18:15:00","gmt_time_end_last":"2017-08-15 18:15:00","rrule":null,"timezone":"America\/New_York"},"extras":["free_food"],"related_files":{"248857":{"fid":null,"name":"Margaret E. Kosal","file_path":"\/sites\/default\/files\/images\/16%20x%209%20Aspect%20Ratio%20%283200%20x%201800%20px%29%20%281%29_1.jpg","file_full_path":"http:\/\/hg.gatech.edu\/\/sites\/default\/files\/images\/16%20x%209%20Aspect%20Ratio%20%283200%20x%201800%20px%29%20%281%29_1.jpg","mime":"image\/jpeg","size":306354,"description":null}},"groups":[{"id":"213791","name":"3D Systems Packaging Research Center"},{"id":"198081","name":"Georgia Electronic Design Center (GEDC)"},{"id":"197261","name":"Institute for Electronics and Nanotechnology"},{"id":"1271","name":"NanoTECH"},{"id":"213771","name":"The Center for MEMS and Microsystems Technologies"}],"categories":[],"keywords":[{"id":"174916","name":"Atom probe tomography"},{"id":"109341","name":"Materials Characterization Facility"},{"id":"107","name":"Nanotechnology"},{"id":"12701","name":"Institute for Electronics and Nanotechnology"},{"id":"58051","name":"Institute for Materials"},{"id":"172434","name":"microscopy techniques"},{"id":"174917","name":"analytical characterization"},{"id":"174918","name":"School of Materials Science and Engineeering"},{"id":"1925","name":"Electrical and Computer Engineering"},{"id":"87681","name":"thin films"},{"id":"170441","name":"Advanced Semiconductor Manufacturing"},{"id":"174919","name":"3D chemical mapping"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"10377","name":"Career\/Professional development"},{"id":"1795","name":"Seminar\/Lecture\/Colloquium"},{"id":"26411","name":"Training\/Workshop"}],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"78771","name":"Public"},{"id":"174045","name":"Graduate students"},{"id":"78751","name":"Undergraduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003E\u003Cstrong\u003EEric Woods\u003C\/strong\u003E - Georgia Tech: Institute for Electronics and Nanotechnology \u0026amp; Materials Characterization Facility\u003C\/p\u003E\r\n\r\n\u003Cdiv\u003E\r\n\u003Cdiv\u003E\u003Ca href=\u0022mailto:paul.joseph@ien.gatech.edu\u0022 style=\u0022color: #000000;\u0022\u003Eeric,woods@ien.gatech.edu\u003C\/a\u003E\u003C\/div\u003E\r\n\u003C\/div\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}