{"592954":{"#nid":"592954","#data":{"type":"event","title":"Surface Science Techniques \u2013 Focus on Photoelectron Spectroscopy and ToF-SIMS","body":[{"value":"\u003Ch2\u003E\u003Cstrong\u003EAnnouncing a New Short Course:\u0026nbsp;\u003C\/strong\u003E\u003Cstrong\u003ESurface Science Techniques \u0026ndash; Focus on Photoelectron Spectroscopy and ToF-SIMS\u003C\/strong\u003E\u003C\/h2\u003E\r\n\r\n\u003Cp\u003E\u0026nbsp;\u003C\/p\u003E\r\n\r\n\u003Cp\u003EA detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method and ToF-SIMS a mass-spectroscopy-based method complementary in many ways to XPS.\u0026nbsp; Taken together they allow:\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u0026middot;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;The detection of the elemental composition of a sample\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u0026middot;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;The detection of even trace elements down to ppm of a monolayer\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u0026middot;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;The chemical bonding between elements\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u0026middot;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;The lateral and vertical distribution of elements in the top layers of a sample\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u0026middot;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;The surface bonding and band structure of compounds including work function and band occupancy\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003ETarget Audience:\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cbr \/\u003E\r\n\u003Cstrong\u003EAttendance is open to the general technical community and is not limited to current Georgia Tech students or IEN users.\u003C\/strong\u003E\u0026nbsp;The course will be of value to anyone needing to analyze the physical-chemical properties of surfaces including catalysts; thin-film metals and semiconductors; low-dimensional materials such as graphene, CNT\u0026#39;s, and MoS2; polymers for food packaging or medical implants; corrosion studies in metals; among other materials. The course should prove useful to everyone from the interested novice, unfamiliar with these techniques - but with a practical need for information about the surface composition\/chemistry of a sample - up to those with even a moderately advanced practical XPS or SIMS background looking to develop a deeper understanding.\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u0026nbsp;\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003EPreliminary Agenda\u003C\/strong\u003E\u003Cbr \/\u003E\r\n\u003Cstrong\u003EDay1 \u0026ndash; Photoelectron Spectroscopy:\u003C\/strong\u003E\u003Cbr \/\u003E\r\n\u0026nbsp; 9:00am -\u0026nbsp; Introduction and Scope of Short Course \u0026ndash; Prof. F. Alamgir\u003Cbr \/\u003E\r\n\u0026nbsp; 9:15am\u0026nbsp; - 10:00:\u0026nbsp;Lecture pt. I:\u0026nbsp; Theoretical background of Photoelectron Spectroscopy\u003Cbr \/\u003E\r\n10:05am\u0026nbsp; - 10:30:\u0026nbsp;Tour of MCF characterization labs\u003Cbr \/\u003E\r\n10:35am\u0026nbsp; -\u0026nbsp; 10:45:\u0026nbsp;Coffee break\u003Cbr \/\u003E\r\n10:50am\u0026nbsp; - 11:35:\u0026nbsp;Lecture pt. II:\u0026nbsp; Theoretical background of Photoelectron Spectroscopy\u003Cbr \/\u003E\r\n12:00pm\u0026nbsp; - 1:00:\u0026nbsp;Lunch break\u003Cbr \/\u003E\r\n\u0026nbsp; 1:05pm\u0026nbsp; -\u0026nbsp; 1:45:\u0026nbsp;Introduction to XPS analysis software\u003Cbr \/\u003E\r\n\u0026nbsp; 1:45pm\u0026nbsp; - 3:05: XPS hands-on operation and data analysis sessions.\u0026nbsp;\u003Cbr \/\u003E\r\n\u0026nbsp; 3:10 - 4:00pm:\u0026nbsp;General comments:\u0026nbsp; Open question and answer session\u003Cbr \/\u003E\r\n\u003Cbr \/\u003E\r\n\u003Cstrong\u003EDay2 \u0026ndash; Time of Flight SIMS:\u003C\/strong\u003E\u003Cbr \/\u003E\r\n\u0026nbsp; 9:30am - Introduction \u0026ndash; Professor Faisal Alamgir\u003Cbr \/\u003E\r\n\u0026nbsp; 9:35 - 10:15am: Lecture pt. I:\u0026nbsp; Theoretical background of SIMS\/ ToF-SIMS\u003Cbr \/\u003E\r\n10:15 - 10:30am:\u0026nbsp;Tour of IEN microfabrication facility\u003Cbr \/\u003E\r\n10:35 - 10:45am:\u0026nbsp;Coffee break\u003Cbr \/\u003E\r\n10:50 - 11:30am: Practical concerns for ToF-SIMS and Alternate Surface Science Techniques\u003Cbr \/\u003E\r\n11:30 - 1:00am:\u0026nbsp;Lunch break\u003Cbr \/\u003E\r\n\u0026nbsp; 1:05 - 1:15am:\u0026nbsp;Introduction to ToF-SIMS analysis software\u003Cbr \/\u003E\r\n\u0026nbsp; 1:15 - 3:15am:\u0026nbsp;ToF-SIMS for hands-on analysis session.\u003Cbr \/\u003E\r\n\u0026nbsp; 3:20 - 3:55am:\u0026nbsp;Open question and answer session\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u0026nbsp;\u003C\/p\u003E\r\n\r\n\u003Ch2\u003E\u003Cstrong\u003E\u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp;\u003Ca href=\u0022http:\/\/events.r20.constantcontact.com\/register\/event?oeidk=a07ee6b08vn5bc4f78a\u0026amp;llr=m48bm8rab\u0022\u003ERegister Here\u003C\/a\u003E\u003C\/strong\u003E\u003C\/h2\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"Save the Date for a New Short Course: Surface Science Techniques \u2013 Focus on Photoelectron Spectroscopy and ToF-SIMS"}],"uid":"32022","created_gmt":"2017-06-26 16:09:04","changed_gmt":"2017-07-19 14:42:29","author":"Farlenthia Walker","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2017-08-17T10:00:00-04:00","event_time_end":"2017-08-18T17:00:00-04:00","event_time_end_last":"2017-08-18T17:00:00-04:00","gmt_time_start":"2017-08-17 14:00:00","gmt_time_end":"2017-08-18 21:00:00","gmt_time_end_last":"2017-08-18 21:00:00","rrule":null,"timezone":"America\/New_York"},"extras":[],"groups":[{"id":"217141","name":"Georgia Tech Materials Institute"}],"categories":[],"keywords":[],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"26411","name":"Training\/Workshop"}],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"78771","name":"Public"},{"id":"174045","name":"Graduate students"},{"id":"78751","name":"Undergraduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003E\u003Cstrong\u003E\u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp;\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003EProfessor Faisal Alamgir\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Ca href=\u0022mailto:faisal.alamgir@mse.gatech.edu\u0022\u003Efaisal.alamgir@mse.gatech.edu\u003C\/a\u003E\u0026nbsp;\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cbr \/\u003E\r\nWalter Henderson\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Ca href=\u0022mailto:walter.henderson@gatech.edu\u0022\u003Ewalter.henderson@gatech.edu\u003C\/a\u003E\u003C\/p\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}