Day1 – Photoelectron Spectroscopy:
09:00 Introduction and Scope of Short Course – Prof. F. Alamgir
09:15 – 10:00: Lecture pt. I: Theoretical background of Photoelectron Spectroscopy
10:05 – 10:30: Tour of MCF characterization labs
10:35 – 10:45: Coffee break
10:50 – 11:35: Lecture pt. II: Theoretical background of Photoelectron Spectroscopy
12:00 – 13:00: Lunch break
13:05 – 13:45: Introduction to XPS analysis software
13:45 – 15:05: XPS hands-on operation and data analysis sessions.
15:10 – 16:00: General comments: Open question and answer session
Day2 – Time of Flight SIMS:
09:30 Introduction– Prof. F. Alamgir
09:35 – 10:15: Lecture pt. I: Theoretical background of SIMS/ ToF-SIMS
10:15 – 10:30: Tour of IEN microfabrication facility
10:35 – 10:45: Coffee break
10:50 – 11:30: Practical concerns for ToF-SIMS and Alternate Surface Science Techniques
11:30 – 13:00: Lunch break
13:05 – 13:15: Introduction to ToF-SIMS analysis software
13:15 – 15:15: ToF-SIMS for hands-on analysis session.
15:20 – 15:55: Open question and answer session
Questions? Please contact:
Prof. Faisal Alamgir, faisal.alamgir@mse.gatech.edu , or
Walter Henderson, walter.henderson@gatech.edu