{"592744":{"#nid":"592744","#data":{"type":"event","title":"Materials Characterization Short Course: Surface Science Techniques \u2013 Focus on Photoelectron Spectroscopy and ToF-SIMS","body":[{"value":"\u003Cp\u003E\u003Cstrong\u003EPreliminary Agenda\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003EDay1 \u0026ndash; Photoelectron Spectroscopy:\u003C\/strong\u003E\u003Cbr \/\u003E\r\n09:00\u0026nbsp;\u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp; \u0026nbsp;\u0026nbsp; Introduction and Scope of Short Course \u0026ndash; Prof. F. Alamgir\u003Cbr \/\u003E\r\n09:15 \u0026ndash; 10:00:\u0026nbsp; Lecture pt. I:\u0026nbsp; Theoretical background of Photoelectron Spectroscopy\u003Cbr \/\u003E\r\n10:05 \u0026ndash; 10:30:\u0026nbsp; Tour of MCF characterization labs\u003Cbr \/\u003E\r\n10:35 \u0026ndash; 10:45:\u0026nbsp; Coffee break\u003Cbr \/\u003E\r\n10:50 \u0026ndash; 11:35:\u0026nbsp; Lecture pt. II:\u0026nbsp; Theoretical background of Photoelectron Spectroscopy\u003Cbr \/\u003E\r\n12:00 \u0026ndash; 13:00:\u0026nbsp; Lunch break\u003Cbr \/\u003E\r\n13:05 \u0026ndash; 13:45:\u0026nbsp; Introduction to XPS analysis software\u003Cbr \/\u003E\r\n13:45 \u0026ndash; 15:05: \u0026nbsp;XPS hands-on operation and data analysis sessions.\u0026nbsp;\u003Cbr \/\u003E\r\n15:10 \u0026ndash; 16:00:\u0026nbsp; General comments:\u0026nbsp; Open question and answer session\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003EDay2 \u0026ndash; Time of Flight SIMS:\u003C\/strong\u003E\u003Cbr \/\u003E\r\n09:30\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp; Introduction\u0026ndash; Prof. F. Alamgir\u003Cbr \/\u003E\r\n09:35 \u0026ndash; 10:15:\u0026nbsp; Lecture pt. I:\u0026nbsp; Theoretical background of SIMS\/ ToF-SIMS\u003Cbr \/\u003E\r\n10:15 \u0026ndash; 10:30:\u0026nbsp; Tour of IEN microfabrication facility\u003Cbr \/\u003E\r\n10:35 \u0026ndash; 10:45:\u0026nbsp; Coffee break\u003Cbr \/\u003E\r\n10:50 \u0026ndash; 11:30:\u0026nbsp;\u0026nbsp; Practical concerns for ToF-SIMS and Alternate Surface Science Techniques\u003Cbr \/\u003E\r\n11:30 \u0026ndash; 13:00: \u0026nbsp; Lunch break\u003Cbr \/\u003E\r\n13:05 \u0026ndash; 13:15:\u0026nbsp;\u0026nbsp; Introduction to ToF-SIMS analysis software\u003Cbr \/\u003E\r\n13:15 \u0026ndash; 15:15:\u0026nbsp;\u0026nbsp; ToF-SIMS for hands-on analysis session.\u003Cbr \/\u003E\r\n15:20 \u0026ndash; 15:55: \u0026nbsp; Open question and answer session\u003Cbr \/\u003E\r\n\u0026nbsp;\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Ca href=\u0022http:\/\/events.r20.constantcontact.com\/register\/event?oeidk=a07ee6b08vn5bc4f78a\u0026amp;llr=m48bm8rab\u0022\u003E\u003Cstrong\u003ERegsiter Here\u003C\/strong\u003E\u003C\/a\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003EQuestions? Please contact:\u003Cbr \/\u003E\r\nProf. Faisal Alamgir, \u003Ca href=\u0022mailto:faisal.alamgir@mse.gatech.edu\u0022\u003Efaisal.alamgir@mse.gatech.edu\u003C\/a\u003E , or\u003Cbr \/\u003E\r\nWalter Henderson, \u003Ca href=\u0022mailto:walter.henderson@gatech.edu\u0022\u003Ewalter.henderson@gatech.edu\u003C\/a\u003E\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"Save the Date for a New Short Course: Surface Science Techniques \u2013 Focus on Photoelectron Spectroscopy and ToF-SIMS. Course dates = Aug. 17 \u0026 18. Registration opens July 6th, 2017."}],"uid":"27863","created_gmt":"2017-06-15 19:12:32","changed_gmt":"2017-07-27 16:36:20","author":"Christa Ernst","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2017-08-17T10:00:00-04:00","event_time_end":"2017-08-17T17:00:00-04:00","event_time_end_last":"2017-08-17T17:00:00-04:00","gmt_time_start":"2017-08-17 14:00:00","gmt_time_end":"2017-08-17 21:00:00","gmt_time_end_last":"2017-08-17 21:00:00","rrule":"RRULE:FREQ=DAILY;INTERVAL=1;UNTIL=20170819T035959Z;WKST=SU","timezone":"America\/New_York"},"extras":[],"groups":[{"id":"197261","name":"Institute for Electronics and Nanotechnology"}],"categories":[],"keywords":[{"id":"146461","name":"electron microscopy"},{"id":"167218","name":"short course"},{"id":"97571","name":"ToF-SIMS"},{"id":"172434","name":"microscopy techniques"},{"id":"174703","name":"Photoelectron Spectroscopy"},{"id":"166968","name":"the Institute for Electronics and Nanotechnology"},{"id":"174704","name":"the Materials Characterizaton Facility"},{"id":"168536","name":"the Institue for Materials"},{"id":"117271","name":"IMat"},{"id":"168357","name":"The School of Materials Science and Engineering"},{"id":"173625","name":"The School of Mechanical Engineering"},{"id":"168380","name":"the School of Electrical and Computer Engineering"},{"id":"249","name":"Biomedical Engineering"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"10377","name":"Career\/Professional development"},{"id":"1795","name":"Seminar\/Lecture\/Colloquium"},{"id":"26411","name":"Training\/Workshop"}],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"78771","name":"Public"},{"id":"174045","name":"Graduate students"},{"id":"78751","name":"Undergraduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003EProf. Faisal Alamgir, \u003Ca href=\u0022mailto:faisal.alamgir@mse.gatech.edu\u0022\u003Efaisal.alamgir@mse.gatech.edu\u003C\/a\u003E , or\u003Cbr \/\u003E\r\nWalter Henderson, \u003Ca href=\u0022mailto:walter.henderson@gatech.edu\u0022\u003Ewalter.henderson@gatech.edu\u003C\/a\u003E\u003C\/p\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}