File photo of a commonly used cantilever for atomic force microscopy.

Additional Information

Groups

Research Horizons

Categories

Research, Biotechnology, Health, Bioengineering, Genetics, Chemistry and Chemical Engineering, Engineering, Life Sciences and Biology, Nanotechnology and Nanoscience

Keywords

cantilever, atomic force microscopy, AFM, electronic white noise, Professor Todd Sulchek

Status

• Created By: Ben Brumfield
• Workflow Status: Published
• Created On: Nov 21, 2016 - 10:00am
• Last Updated: Nov 21, 2016 - 10:00am