{"516861":{"#nid":"516861","#data":{"type":"event","title":"ECE Seminar (ECE 2002A\/ECE 8002A)","body":[{"value":"\u003Cp\u003E\u003Cstrong\u003ESpeaker:\u003C\/strong\u003E Mr. Anthony A. Carey, Senior Technical Manager, Honeywell FM\u0026amp;T Test Engineering\u003C\/p\u003E\u003Cp\u003E\u003Cstrong\u003ETitle:\u003C\/strong\u003E \u003Cem\u003EHow to leverage real-time data from automated test systems (ATS) to inform decisions\u003C\/em\u003E\u003C\/p\u003E\u003Cp\u003E\u003Cstrong\u003EAbstract:\u003C\/strong\u003E\u003C\/p\u003E\u003Cp\u003E\u003Cstrong\u003EBig Data Analytics\u0026nbsp;\u003C\/strong\u003E\u0026nbsp;\u003C\/p\u003E\u003Cp\u003EThe National Security Campus (NSC) collects a large amount of test data used to accept high value and high rigor product. The data has been used historically to support root cause analysis when anomalies are detected in down-stream processes. The opportunity to use the data for predictive failure analysis however, had never been exploited.\u003C\/p\u003E\u003Cp\u003EThe primary goal of the Test Data Monitor (TDM) software is to provide automated capabilities to analyze data in near-real-time and report trends that foreshadow actual product failures. To date, the aerospace industry as a whole is challenged at utilizing collected data to the degree that modern technology allows. As a result of the innovation behind TDM, Honeywell is able to monitor millions of data points through a multitude of SPC algorithms continuously and autonomously so that our personnel resources can more efficiently and accurately direct their attention to suspect processes or features.\u0026nbsp; TDM\u2019s capabilities have been recognized by our U.S. Department of Energy National Nuclear Security Administration (NNSA) sponsor for potential use at other sites within the NNSA. This activity supports multiple initiatives including expectations of the NNSA and broader corporate goals that center around data-based quality controls on production.\u003C\/p\u003E\u003Cp\u003E\u003Cstrong\u003EAugmented Reality\u0026nbsp;\u003C\/strong\u003E\u0026nbsp;\u003C\/p\u003E\u003Cp\u003EThe National Security Campus (NSC) performs tests on a wide array of products and materials to gain information such as velocity, positional displacement, stress, strain, projectile, directional movement, and unit under test (UUT) orientation. Conventional measurement methods can be limited in the type and amount of data they provide resulting in the need for many different tests or the inability to acquire particular metrics for a UUT.\u003C\/p\u003E\u003Cp\u003EDigital Image Correlation (DIC) is a non-contact optical measurement method that utilizes high-resolution\/high-speed video and cross-correlation algorithms to track deformation of a speckled UUT. It is a versatile technique that allows for the extraction of metrics from dynamic events, including: pull tests, drop tests (vertical and horizontal), mechanical rotation, mechanical actuation, and vibration. In addition to enhancing the NSC\u2019s non-destructive analysis capabilities, DIC can provide significant cost avoidances, on the order of millions, through early identification of adverse product behaviors that cannot easily be measured otherwise.\u003Cbr \/\u003E\u003Cbr \/\u003E\u003C\/p\u003E\u003Cp\u003E\u003Cstrong\u003ESpeaker Bio:\u003C\/strong\u003E \u003Cbr \/\u003EAnthony Carey is not just focused on developing the next generation of Test Systems for our nation\u2019s military, he\u2019s also focused on developing the next generation of young leaders.\u0026nbsp; He was inducted into the Kansas City Black Achiever\u2019s Society in 2014 which is comprised of nearly 500 African American businessmen and women who were nominated by their employers over the past 40 years as exemplary leaders in their corporate roles as well as their involvement in the community.\u003C\/p\u003E\u003Cp\u003EAt 17 years old, Anthony was selected as one of two boys in the state of Kansas to represent Boys Nation in Washington, D.C. He met President Clinton at the White House in 1996 and discussed the exciting opportunity to have the Summer Olympics in the United States that year in Atlanta.\u003C\/p\u003E\u003Cp\u003EAnthony holds a bachelor\u2019s degree from Kansas State University in mechanical engineering, and an M.B.A. from Rockhurst University.\u003C\/p\u003E","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":[{"value":"\u003Cp\u003ESeminar with Mr. Anthony A. Carey, Senior Technical Manager, Honeywell FM\u0026amp;T Test Engineering\u003C\/p\u003E\u003Cp\u003E.\u003Cstrong\u003E\u003Cbr \/\u003E \u003Cbr \/\u003E \u003Cbr \/\u003E \u003Cbr \/\u003E \u003Cbr \/\u003E \u003Cbr \/\u003E \u003C\/strong\u003E\u003C\/p\u003E","format":"limited_html"}],"field_summary_sentence":[{"value":"How to leverage real-time data from automated test systems (ATS) to inform decisions"}],"uid":"27842","created_gmt":"2016-03-23 20:10:58","changed_gmt":"2017-04-13 21:16:13","author":"Ashlee Gardner","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2016-03-30T12:05:00-04:00","event_time_end":"2016-03-30T12:55:00-04:00","event_time_end_last":"2016-03-30T12:55:00-04:00","gmt_time_start":"2016-03-30 16:05:00","gmt_time_end":"2016-03-30 16:55:00","gmt_time_end_last":"2016-03-30 16:55:00","rrule":null,"timezone":"America\/New_York"},"extras":[],"groups":[{"id":"1255","name":"School of Electrical and Computer Engineering"}],"categories":[],"keywords":[{"id":"1577","name":"career"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"1795","name":"Seminar\/Lecture\/Colloquium"}],"invited_audience":[{"id":"78751","name":"Undergraduate students"},{"id":"78761","name":"Faculty\/Staff"},{"id":"174045","name":"Graduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003EPaul Steffes\u003C\/p\u003E\u003Cp\u003ESchool of Electrical and Computer Engineering\u003C\/p\u003E\u003Cp\u003E404-894-3128\u003C\/p\u003E\u003Cp\u003E\u003Ca href=\u0022mailto:paul.steffes@ece.gatech.edu\u0022\u003Epaul.steffes@ece.gatech.edu\u003C\/a\u003E\u003C\/p\u003E","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}