Committee: 

Dr. Milor, Advisor        

Dr. Keezer, Chair

Dr. Naeemi

Abstract: The objective of this research is to extract NBTI and GOBD model parameters to enable the estimation of the remaining life of individual chips.  For the parameter extraction, the device-level models of both reliability mechanisms are modelled with the RTN model.  The ability to predict a lifetime enables the optimization of timing guardbands or circuit adaptation based on a prediction of the increase in delay as a function of time, temperature, and usage.  The proposed approach involves the use of measurements of variation in the ground, power supply, and I/O signals.  These measurements are linked to not only extract model parameters but also estimate the remaining lifetime of ICs accurately.