{"506001":{"#nid":"506001","#data":{"type":"event","title":"Ph.D. Proposal Oral Exam - Soonyoung Cha","body":[{"value":"\u003Cp\u003E\u003Cstrong\u003ETitle:\u0026nbsp; \u003C\/strong\u003E\u003Cem\u003EFrontend Reliability Analysis and Modeling from Device to Integrated Circuits\u003C\/em\u003E\u003C\/p\u003E\u003Cp\u003E\u003Cstrong\u003ECommittee:\u0026nbsp; \u003C\/strong\u003E\u003C\/p\u003E\u003Cp\u003EDr. Milor, Advisor\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u003C\/p\u003E\u003Cp\u003EDr. Keezer, Chair\u003C\/p\u003E\u003Cp\u003EDr. Naeemi\u003C\/p\u003E\u003Cp\u003E\u003Cstrong\u003EAbstract: \u003C\/strong\u003EThe objective of this research is to extract NBTI and GOBD model parameters to enable the estimation of the remaining life of individual chips.\u0026nbsp; For the parameter extraction, the device-level models of both reliability mechanisms are modelled with the RTN model.\u0026nbsp; The ability to predict a lifetime enables the optimization of timing guardbands or circuit adaptation based on a prediction of the increase in delay as a function of time, temperature, and usage.\u0026nbsp; The proposed approach involves the use of measurements of variation in the ground, power supply, and I\/O signals.\u0026nbsp; These measurements are linked to not only extract model parameters but also estimate the remaining lifetime of ICs accurately.\u003C\/p\u003E","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"ECE Proposal Oral Exam"}],"uid":"28475","created_gmt":"2016-02-24 17:13:59","changed_gmt":"2016-10-08 02:16:41","author":"Daniela Staiculescu","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2016-03-02T09:00:00-05:00","event_time_end":"2016-03-02T11:00:00-05:00","event_time_end_last":"2016-03-02T11:00:00-05:00","gmt_time_start":"2016-03-02 14:00:00","gmt_time_end":"2016-03-02 16:00:00","gmt_time_end_last":"2016-03-02 16:00:00","rrule":null,"timezone":"America\/New_York"},"extras":[],"groups":[{"id":"434371","name":"ECE Ph.D. Proposal Oral Exams"}],"categories":[],"keywords":[{"id":"1808","name":"graduate students"},{"id":"102851","name":"Phd proposal"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"1788","name":"Other\/Miscellaneous"}],"invited_audience":[{"id":"78771","name":"Public"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[],"email":[],"slides":[],"orientation":[],"userdata":""}}}