Testing chips at cold temperature

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Georgia Tech Professor John Cressler and Phd student Ram Krithivasan examine a silicon germanium chip inside a cryogenic test station at the Georgia Electronic Design Center at Georgia Tech in Atlanta.

Additional Information

Groups

Research Horizons

Categories
Institute and Campus, Student and Faculty
Keywords
laureates, lindau, Nobel, ringer
Status
  • Created By: John Toon
  • Workflow Status: Published
  • Created On: Dec 3, 2015 - 4:26pm
  • Last Updated: Oct 7, 2016 - 10:44pm