AFM holder

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An AFM holder adapted so that the FIRAT probe can be used on existing AFM systems. The FIRAT probe can simultaneously measure topography and material properties including adhesion, stiffness, elasticity and viscosity. (Georgia Tech Photo: Gary Meek)

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  • Created By: Abby Vogel Robinson
  • Workflow Status: Published
  • Created On: Dec 3, 2015 - 4:16pm
  • Last Updated: Oct 7, 2016 - 10:43pm