
A single crystal sample is placed onto the measurement stage of the modified atomic force microscope (i.e. piezoresponse force microscope). (Photo: Rob Felt, Georgia Tech)
Additional Information
- Groups
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Georgia Tech Materials Institute, Research Horizons
- Categories
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Research, Computer Science/Information Technology and Security, Engineering, Physics and Physical Sciences
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No keywords were submitted.
- Status
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- Created By: John Toon
- Workflow Status: Published
- Created On: Aug 15, 2019 - 8:20pm
- Last Updated: Aug 15, 2019 - 8:20pm