A single crystal sample is placed onto the measurement stage of the modified atomic force microscope (i.e. piezoresponse force microscope). (Photo: Rob Felt, Georgia Tech)

Additional Information

Groups

Georgia Tech Materials Institute, Research Horizons

Categories

Research, Computer Science/Information Technology and Security, Engineering, Physics and Physical Sciences

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Status

• Created By: John Toon
• Workflow Status: Published
• Created On: Aug 15, 2019 - 8:20pm
• Last Updated: Aug 15, 2019 - 8:20pm