Atomic Force Microscope Analysis

Atomic Force Microscope Analysis

Georgia Tech Ph.D. Candidate Lee Griffin places the single crystal sample onto the measurement stage of the modified atomic force microscope (i.e. piezoresponse force microscope). (Photo: Rob Felt, Georgia Tech)

Additional Information

Groups

Georgia Tech Materials Institute, Research Horizons

Categories
Research, Computer Science/Information Technology and Security, Physics and Physical Sciences
Keywords
atomic force microscope, materials, ferroelectric, machine learning
Status
  • Created By: John Toon
  • Workflow Status: Published
  • Created On: Aug 15, 2019 - 8:18pm
  • Last Updated: Aug 15, 2019 - 8:18pm