Atomic Force Microscope Analysis

Atomic Force Microscope Analysis

Georgia Tech Ph.D. Candidate Lee Griffin places the single crystal sample onto the measurement stage of the modified atomic force microscope (i.e. piezoresponse force microscope). (Photo: Rob Felt, Georgia Tech)

Additional Information


Georgia Tech Materials Institute, Research Horizons

Research, Computer Science/Information Technology and Security, Physics and Physical Sciences
atomic force microscope, materials, ferroelectric, machine learning
  • Created By: John Toon
  • Workflow Status: Published
  • Created On: Aug 15, 2019 - 8:18pm
  • Last Updated: Aug 15, 2019 - 8:18pm