Madhavan Swaminathan, professor and John Pippin Chair in Microsystems Packaging & Electromagnetics in the Georgia Tech School of Electrical and Computer Engineering (ECE), and ECE postdoctoral fellow Mourab Larbi have received the Best Paper Award at the 23rd IEEE Workshop on Signal and Power Integrity. The workshop was held June 18 – 21 in Chambéry, France.

The winning paper titled “Statistical Analysis of the Efficiency of an Integrated Voltage Regulator by Means of a Machine Learning Model Coupled with Kriging Regression” represents work based on a joint EU project between Politecnico di Torino and Georgia Tech. Politecnico di Torino visiting faculty members Riccardo Trinchero and Flavio Canavero were co-authors on the paper.

The subject of the paper considers surrogate models which are often used to make predictions in Machine Learning. These predictions are always uncertain unless confidence bounds can be established. In this paper, a method has been developed to quantify such uncertainties and applied to Integrated Voltage Regulators (IVR) that can be used to improve the efficiency of power delivery solutions in semiconductor packaging.