ISYE SEMINAR SERIES - Reliability and Yield of Microelectronics Products

Event Details
  • Date/Time:
    • Thursday March 20, 2003 - Wednesday March 19, 2003
      1:00 pm - 11:00 pm
  • Location: ISyE 226A
  • Phone:
  • URL:
  • Email:
  • Fee(s):
    N/A
  • Extras:
Contact
Barbara Christopher
Industrial and Systems Engineering
Contact Barbara Christopher
404.385.3102
Summaries

Summary Sentence: ISYE SEMINAR SERIES - Reliability and Yield of Microelectronics Products

Full Summary: ISYE SEMINAR SERIES - Reliability and Yield of Microelectronics Products

In this talk, we present an overview of yield, reliability and burn-in as practiced in the semiconductor manufacturing industry. Reliability and yield modeling can be used as a foundation in developing effective stress burn-in, which in turn can warranty high-quality for semiconductor products. Yield models are described and their advantages and disadvantages are
discussed. It is high reliability, not an efficient scheduling, that can enhance yield of microelectronics products. Stress burn-in and issues related to burn-in, such as optimization and statistical data analysis are
introduced in this talk. Because low yield will likely be a biggest issue in nano manufacturing, this talk will also help deal with reliability enhance strategies for design and manufacturing of nano products.

Additional Information

In Campus Calendar
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Groups

H. Milton Stewart School of Industrial and Systems Engineering (ISYE)

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Categories
Seminar/Lecture/Colloquium
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Status
  • Created By: Barbara Christopher
  • Workflow Status: Published
  • Created On: Oct 8, 2010 - 7:42am
  • Last Updated: Oct 7, 2016 - 9:52pm